• Semiconductor Optoelectronics
  • Vol. 43, Issue 4, 828 (2022)
ZHANG Chuancong1,2,3, LI Fanming1,*, and RAO Junmin1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.16818/j.issn1001-5868.2022032901 Cite this Article
    ZHANG Chuancong, LI Fanming, RAO Junmin. Infrared Small Target Detection Based on Feature Saliency Fusion[J]. Semiconductor Optoelectronics, 2022, 43(4): 828 Copy Citation Text show less
    References

    [1] Zeng M, Li J X, Peng Z. The design of Top-Hat morphological filter and application to infrared target detection[J]. Infrared Phys. & Technol., 2006, 48(1): 67-76.

    [5] Li Z Z, Chen C, Liu D P, et al. Infrared small target tracking algorithm based on temporal-spatial structure sparse bayesian estimation[J]. Infrared Phys. & Technol., 2020, 105: 103160.

    [6] Shang K, Sun X, Tian J W, et al. Infrared small target detection via line-based reconstruction and entropy-induced suppression[J]. Infrared Phys. & Technol., 2016, 76: 75-81.

    [11] Chen C L P, Li H, Wei Y T, et al. A local contrast method for small infrared target detection[J]. IEEE Trans. on Geoscience and Remote Sensing, 2013, 52(1): 574-581.

    [12] Xia C Q, Li X R, Zhao L Y, et al. Infrared small target detection based on multiscale local contrast measure using local energy factor[J]. IEEE Geoscience and Remote Sensing Lett., 2020, 17(1): 157-161.

    [13] Liu J, He Z Q, Chen Z L, et al. Tiny and dim infrared target detection based on weighted local contrast[J]. IEEE Geoscience and Remote Sensing Lett., 2018, 15(11): 1780-1784.

    [14] Han J H, Ma Y, Fan F, et al. A robust infrared small target detection algorithm based on human visual system[J]. IEEE Trans. on Geoscience and Remote Sensing, 2014, 11(12): 2168-2172.

    [15] Hou X D, Zhang L Q. Saliency detection: a spectral residual approach[C]// Proc. 2007 IEEE Conf. on Computer Vision and Pattern Recognition, 2007: 1-8.

    ZHANG Chuancong, LI Fanming, RAO Junmin. Infrared Small Target Detection Based on Feature Saliency Fusion[J]. Semiconductor Optoelectronics, 2022, 43(4): 828
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