• Electronics Optics & Control
  • Vol. 28, Issue 12, 67 (2021)
YAO Keming, LI Dawei, and ZHANG Benhui
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  • [in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2021.12.014 Cite this Article
    YAO Keming, LI Dawei, ZHANG Benhui. Sensitivity Analysis of Reliability Parameters Based on Uncertainty Theory[J]. Electronics Optics & Control, 2021, 28(12): 67 Copy Citation Text show less
    References

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    YAO Keming, LI Dawei, ZHANG Benhui. Sensitivity Analysis of Reliability Parameters Based on Uncertainty Theory[J]. Electronics Optics & Control, 2021, 28(12): 67
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