• Optics and Precision Engineering
  • Vol. 25, Issue 2, 304 (2017)
YAO Xue-feng1,2,*, CUI Ji-cheng1, YIN Lu1,2, SONG Nan1, and SUN Ci1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/ope.20172402.0304 Cite this Article
    YAO Xue-feng, CUI Ji-cheng, YIN Lu, SONG Nan, SUN Ci. Calibration devices for band range of echelle spectrometer[J]. Optics and Precision Engineering, 2017, 25(2): 304 Copy Citation Text show less

    Abstract

    In order to ensure full waveband range of echelle spectrometers, a set of calibration devices was designed. The principle, range and resolution of the calibration were discussed and studied. First, tolerance analysis of optical elements in the echelle spectrometer was performed, and the principle and process of auto spectrum calibration were introduced. Taking the focusing mirror as the adjusting object, the requirement of adjusting resolution was given according to the usage of the CCD image. Furthermore, a set of calibration device was designed, and the calibration resolution of the devices was calculated and experimentally verified. The results show that the azimuth calibration resolution is up to 0.006 25°, the resolution of the pitching direction is up to 0.006 25° and the resolution of the front and rear direction is up to 0.005 mm. The calibration devices can adjust the 10 pixels band offset to the normal reception range of the CCD, thus ensuring the full spectral band range of the spectrometer.
    YAO Xue-feng, CUI Ji-cheng, YIN Lu, SONG Nan, SUN Ci. Calibration devices for band range of echelle spectrometer[J]. Optics and Precision Engineering, 2017, 25(2): 304
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