[1] HAN G, LI H, ZOU Y. Image reconstruction method of grating atomic force microscope based on blind reconstruction of tip:CN110749751A[P]. 2020-02-04.

[2] WU T, LV L, ZOU Y, et al. Image reconstruction of TGZ3 grating by eliminating tip-sample convolution effect in AFM[J]. Micro & nano letters, 2020, 15(15):1167-1172.

[3] HAN G, WU T, LV L, et al. Super-resolution AFM imaging based on enhanced convolutional neural network[J]. Nano, 2021, 16(12):2150147.

[4] YUAN S, DONG Z, MIAO L, et al. Research on the reconstruction of fast and accurate AFM probe model[J]. Chinese science bulletin, 2010, (24):5.

[5] HAN G, CAO S, WANG X, et al. Blind evaluation of AFM tip shape by using optical glass surface with irregular nanostructures as a tip characterizer[J]. Micro & nano letters, 2017, 12(12):916-919.

[6] ZHANG X, LI S, HAN Z, et al. Effect analysis of surface metal layer on step height standard[J]. Modern physics letters B, 2021:2140006.

[7] WU Z, CAI Y, WANG X, et al. Amorphous Si critical dimension structures with direct Si lattice calibration[J]. Chinese physics B, 2019, 28(3):030601.

[8] ZHAO L, ZHANG X, LI S, et al. Discussion on calibration method of scanning electron microscope based on line spacing standard samples[J]. Computer and digital engineering, 2021, 49(04):644-648.

[9] ZHANG X, LI S, HAN Z, et al. A lattice measuring method based on integral imaging technology[J]. Optoelectronics letters, 2021, 17(5):313-316.

[10] XU L, GUO Q, QIAN S, et al. Self-adaptive grinding for blind tip reconstruction of AFM diamond probe[J]. Nanotechnology and precision engineering, 2018, (2): 150-155.

[11] TEIMOURI M. Blind reconstruction of punctured convolutional codes[J]. Physical communication, 2021, 47: 101297.

[12] HAN Z, LI S, FENG Y, et al. Design and preparation of nanoscale linewidth standard samples[J]. Computer and digital engineering, 2021, 49(4):5.