• Chinese Journal of Lasers
  • Vol. 36, Issue s1, 337 (2009)
Jin Bin1、*, Li Tong2, Zhou Qingli1, Shi Yulei1, and Zhang Cunlin1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    Jin Bin, Li Tong, Zhou Qingli, Shi Yulei, Zhang Cunlin. Investigation of n-Si and p-Si Semiconductors by Terahertz Time-Domain Spectroscopy[J]. Chinese Journal of Lasers, 2009, 36(s1): 337 Copy Citation Text show less
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    [2] D. G. Cooke, A. N. MacDonald, A. Hryciw et al.. Transient terahertz conductivity in photoexcited silicon nanocrystal films[J]. Phys. Rev. B, 2006, 73: 193311-1~193311-4

    [3] Martin van Exter, D. Grischkowsky. Carrier dynamics of electrons and holes in moderately doped silicon[J]. Phys. Rev. B, 1990, 41(17): 12140~12149

    [4] David G. Cooke, A. Nicole MacDonald, Aaron Hryciw et al.. Ultrafast terahertz conductivity of photoexcited nanocrystalline silicon[J]. J. Mater. Sci.: Mater. Electron., 2007, 18: S447~S452

    [5] Zhang Zhenwei, Cui Wweili, Zhang Yan et al.. Terahertz time-domain spectroscopy imaging[J]. J. Infrared Millim. Waves, 2006, 25(3): 217~220

    [6] Wang Xiaohong, Zhang Liangliang, Hu Ying et al.. Applications of terahertz pulse in the DNA molecule[J]. Spectroscopy and Spectral Analysis, 2006, 26(3): 385~391

    [7] Hu Ying, Zhang Cunling, Shen Jingling et al.. Time-domain terahertz spectroscopy of (100)MgO and (100)LaAlO3 substrates[J]. Acta Physica Sinica, 2004, 53(6): 1772~1776

    [8] K. P. H. Lui, F. A. Hegmann. Ultrafast carrier relaxation in radiation-damaged silicon on sapphire studied by optical-pump-teraheretz-probe experiments[J]. Appl. Phys. Lett., 2001, 78: 3478~3480

    [9] M. C. Beard, G. M. Turner, C. A. Schmuttenmaer. Transient photoconductivity in GaAs as measured by time-resolved terahertz spectroscopy[J]. Phys. Rev. B, 2000, 62: 15764~15777

    [10] S. E. Ralph, Y. Chen. Subpicosecond photoconductivity of In0.53Ga0.47As: intervalley scattering rates observed via THz spectroscopy[J]. Phys. Rev. B, 1996, 54: 5568~5573

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    Jin Bin, Li Tong, Zhou Qingli, Shi Yulei, Zhang Cunlin. Investigation of n-Si and p-Si Semiconductors by Terahertz Time-Domain Spectroscopy[J]. Chinese Journal of Lasers, 2009, 36(s1): 337
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