• Optics and Precision Engineering
  • Vol. 26, Issue 12, 2873 (2018)
MA Yun1, CHEN Lei2, LIU Yi-ming2, and ZHU Wen-hua2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/ope.20182612.2873 Cite this Article
    MA Yun, CHEN Lei, LIU Yi-ming, ZHU Wen-hua. Reflective shearing point diffraction interferometer for phase defect measurement[J]. Optics and Precision Engineering, 2018, 26(12): 2873 Copy Citation Text show less
    References

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    MA Yun, CHEN Lei, LIU Yi-ming, ZHU Wen-hua. Reflective shearing point diffraction interferometer for phase defect measurement[J]. Optics and Precision Engineering, 2018, 26(12): 2873
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