Bayes Approach for Nonlinear Degradation Process Modeling of Inertial Device RUL Prediction

YANG Hao-tian; WANG Li-xin; TIAN Ying; TAN Ji-wen

doi:10.3969/j.issn.1671-637x.2016.12.020

Journals >Electronics Optics & Control >Volume 23 >Issue 12 >Page 90 > Article

Electronics Optics & Control
Vol. 23, Issue 12, 90 (2016)

Bayes Approach for Nonlinear Degradation Process Modeling of Inertial Device RUL Prediction

YANG Hao-tian, WANG Li-xin, TIAN Ying, and TAN Ji-wen

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[in Chinese]

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DOI: 10.3969/j.issn.1671-637x.2016.12.020 Cite this Article

YANG Hao-tian, WANG Li-xin, TIAN Ying, TAN Ji-wen. Bayes Approach for Nonlinear Degradation Process Modeling of Inertial Device RUL Prediction[J]. Electronics Optics & Control, 2016, 23(12): 90 Copy Citation Text

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References

[2] WANG W B. A two-stage prognosis model in condition based maintenance［J］. European Journal of Operational Research, 2007, 182(3): 1177-1187.

[3] PECHT M, JAAI R. A prognostics and health management roadmap for information and electrics-rich system［J］. Micro-Electronics Reliability, 2010, 50(3): 317-323.

[8] ZHOU Q, SON J B, ZHOU S Y. Remaining useful life prediction of individual units subject to hard failure［J］. IIE Transaction, 2014, 46：1017-1030.

[12] GEBRAEEL N Z, LAWLEY M A, LI R, et al. Residual life distributions from component degradation signals: a Bayesian approach［J］. IEEE Transactions on Reliability, 2005, 37(6): 543-557.

[14] SI X S, WANG W B, HU C H, et al. Remaining useful life estimation based on a nonlinear diffusion degradation process［J］. IEEE Transactions on Reliability, 2012, 44(1): 50-67.

CLP Journals

[1] MA Jiashun, WU Jianfeng, XUE Xirui, LI Ning. A Life Prediction Method for Multi-source Data Fusion Modeling[J]. Electronics Optics & Control, 2021, 28(7): 88

YANG Hao-tian, WANG Li-xin, TIAN Ying, TAN Ji-wen. Bayes Approach for Nonlinear Degradation Process Modeling of Inertial Device RUL Prediction[J]. Electronics Optics & Control, 2016, 23(12): 90

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