[1] J. F. Ouyang, W. L. Liu, Y. G. Yan, and D. X. Sun, Proc. SPIE 6344, 63442U (2006).
[2] P. Douglas, C. R. Nagarajah, P. Iovenitti, Measurement: Journal of the International Measurement Confederation 26, 167 (1999).
[3] Y. Lin, G. Zhang, and Z. Li, Measurement Science and Technology 14, N36 (2003).
[4] Y. Chung and N. Dagli, IEEE Photon. Technol. Lett. 3, 150 (1991).
[5] Q. Liang, X. Shi, and W. Fu, Chin. J. Lasers (in Chinese) 32, 306 (2005).
[6] F. Henault, P. Hebert, C. Lucchini, and D. Miras, Proc. SPIE 3870, 159 (1999).
