• Opto-Electronic Engineering
  • Vol. 32, Issue 11, 72 (2005)
[in Chinese] and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. Improved multi-scale morphological algorithm for edge detection[J]. Opto-Electronic Engineering, 2005, 32(11): 72 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese]. Improved multi-scale morphological algorithm for edge detection[J]. Opto-Electronic Engineering, 2005, 32(11): 72
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