[2] QU Xue-jun, ZHANG Lu, MENG Biao, et al. A new camera calibration method based on two stages distortion model[C]. Information Science and Management Engineering (ISME), 2010 International Conference, 2010, 2: 125-129.
[3] FERNANDES L A F, OLIVEIRA M M. Real-time line detection through an improved hough transform votings cherne[J]. Pattern Recognition, 2008, 41(1): 299-314.
[4] ZHAO Hui-li, QIN Guo-feng, WANG Xing-jian. Improvement of canny algorithm based on pavement edge detection[C]. Image and Signal Processing (CISP), 2010 3rd International Congress, 2, 964-967.
[5] STEGER C. An unbiased detector of curvilinear structures[R]. Forschungsgruppe Bildverstehen (FG BV), Informatik IX, Technische Universitaet Muenchen, July 1996.
[6] HARALICK R M, SHAPIRO L G. Computer and robot vision[M]. Boston: Addison-Wesley Longman Publishing Co., Inc, 1992:28-48.
[7] BEVINGTON P R. Data reduction and error analysis for the physical sciences[M].New York: McGraw-Hill,1969.
[8] PAN M, ZHANG F, LING H. An image binarization method based on HVS[C]. Multimedia and Expo, 2007 IEEE International Conference on Digital Object Identifier, 2007: 1283-1286.
[9] LYVERS E P, MITCHELL O R, AKEY M L, et al. Subpixel measurements using a moment-based edge operator[J].IEEE Transactions on Pattern Analysis and Machine Intelligence, 1989, 11(12): 1293-1308.
[10] HE Zhong-hai, WANG Bao-guang, LIAO Yi-bai, et al. Subpixel algorithm using a curve fitting method[J]. Chinese Journal of Scientific Instrument, 2003,24(2): 195-197.
[11] FITZGIBBON A, PILU M, FISHER R B. Direct least square fitting of ellipses[J]. IEEE Transcations on Pattern Analysis and Machine Intelligence, 1999, 21(5): 476-480.
[12] HEIKKILA J, SILVEN O. A four-step camera calibration procedure with implicit image correction[C]. Proc of IEEE Computer Society Conference on Computer Vision and Pattern Recognition, Jun 1997, 1106-1112.
[13] SEMPLE J G, KNEEBONE G T. Algebraic projective geometry[M]. New York: Oxford University Press, 1998.
[14] Von MISES R. Mathematical theory of probability and statistics[M]. New York: Academic Press, 1964.