[6] Jakopic G, Par G, Papoueek W. Unified analytical inversion of reflectometric and ellipsometric data of absorbing media[J]. Appl. Op.t, 2000, 39(16): 2727-2732．

[8] Chiu M, Lee J, Su D. Complex refractive-index measurement based on Fresnel′s equations and the uses of heterodyne interferometry[J]. Appl. Opt. 1999, 38(9): 4047-4052

[13] Laaziza Y, Bennouna A, Chadburn N. Optical characterization of lowoptical thickness thin films from transmittance and back reflectance measurements[J]. Thin Solid Films, 2000, 372: 149-155.

[17] Kirkpatrick, S Gelatt, C D Vecchi, M P Kirkpatrik S, et al. Optimization by using simulated annealing[J]. Science, 1983: 671-680.