• Opto-Electronic Engineering
  • Vol. 34, Issue 9, 5 (2007)
[in Chinese]1、2, [in Chinese]1, [in Chinese]1, and [in Chinese]1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Method for measuring the similarity between infrared images of target and its decoy[J]. Opto-Electronic Engineering, 2007, 34(9): 5 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Method for measuring the similarity between infrared images of target and its decoy[J]. Opto-Electronic Engineering, 2007, 34(9): 5
    Download Citation