Analysis and fabrication of antireflection coating with ultralow residual reflectance for single wavelength

Huasong Liu; Yiqin Ji; Zhanshan Wang; Deying Chen; Dandan Liu; Ri Wang; Zhengxiang Shen; Bin Ma; Fuhao Jiang

doi:10.3788/COL201008s1.0207

Journals >Chinese Optics Letters >Volume 8 >Issue s1 >Page 207 > Article

Chinese Optics Letters
Vol. 8, Issue s1, 207 (2010)

Analysis and fabrication of antireflection coating with ultralow residual reflectance for single wavelength

Huasong Liu^1、2, Yiqin Ji^2、3, Zhanshan Wang¹, Deying Chen³, Dandan Liu², Ri Wang², Zhengxiang Shen¹, Bin Ma¹, and Fuhao Jiang⁴

Author Affiliations

¹Institute of Precision Optical Engineering, Tongji University, Shanghai 200192, China

²Tianjin Key Laboratory of Optical Thin Films, Tianjin Jinhang Institute of Technical Physics, Tianjin 300192, China

³Institute of Opto-Electronics, Harbin Institute of Technology, Harbin 150001, China

⁴Beijing Institute of Automation Control Equipment, Beijing 100074, China

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DOI: 10.3788/COL201008s1.0207 Cite this Article Set citation alerts

Huasong Liu, Yiqin Ji, Zhanshan Wang, Deying Chen, Dandan Liu, Ri Wang, Zhengxiang Shen, Bin Ma, Fuhao Jiang. Analysis and fabrication of antireflection coating with ultralow residual reflectance for single wavelength[J]. Chinese Optics Letters, 2010, 8(s1): 207 Copy Citation Text

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References

[1] I. V. Grebenshchikov, Prosvetlenie Optiki (Antireflection Coating of Optical Surfaces) (State Publishers of Technical and Theoretical Literature, Moscow, 1946).

[2] K. Rabinovitch and A. Pagis, Appl. Opt. 14, 1326 (1975).

[3] Y. Ji, Y. Cui, H. Liu, J. Zong, H. Song, W. Hong, F. Jiang, and C. Sun, Infrared Laser Engineering (in Chinese) 37, 505 (2008).

[4] D. Ristau and T. Grob, Proc. SPIE 5963, 596313 (2005).

[5] A. V. Tikhonravov and M. K. Trubetskov, "OptiLayer thin film software", http://www.optilayer.com (May 25, 2009).

[6] Y. Ji, H. Liu, and Y. Zhang, Infrared Laser Engineering (in Chinese) 35, 513 (2006).