• Acta Photonica Sinica
  • Vol. 46, Issue 4, 412001 (2017)
ZHANG Xiao-bao, LUO Hui, TAN Zhong-qi, LIU Wen-bin, and WU Su-yong
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/gzxb20174604.0412001 Cite this Article
    ZHANG Xiao-bao, LUO Hui, TAN Zhong-qi, LIU Wen-bin, WU Su-yong. Effects of Small-scale Surface Roughness and Absorption on Refractive Index Measurement by the Brewster-angle and Critical-angle Techniques[J]. Acta Photonica Sinica, 2017, 46(4): 412001 Copy Citation Text show less
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    ZHANG Xiao-bao, LUO Hui, TAN Zhong-qi, LIU Wen-bin, WU Su-yong. Effects of Small-scale Surface Roughness and Absorption on Refractive Index Measurement by the Brewster-angle and Critical-angle Techniques[J]. Acta Photonica Sinica, 2017, 46(4): 412001
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