• Journal of Applied Optics
  • Vol. 44, Issue 4, 868 (2023)
Siwei LI*, Xuexin WANG, Yi XIE, Yu GUO..., Xiaoyu YAN, Yuxin YANG and Xu ZHANG|Show fewer author(s)
Author Affiliations
  • The First Scale Optical Metrology Station of the Science, Technology and Industry for National Defense, Xi'an Institute of Applied Optics, Xi'an 710065, China
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    DOI: 10.5768/JAO202344.0403008 Cite this Article
    Siwei LI, Xuexin WANG, Yi XIE, Yu GUO, Xiaoyu YAN, Yuxin YANG, Xu ZHANG. Spectral transmittance calibration technology of infrared optical system[J]. Journal of Applied Optics, 2023, 44(4): 868 Copy Citation Text show less
    References

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    [9] YANG Hong, ZHAO Baozhen. The measurement of the transmittance for IR optical systems[C]//The Ninth National Symposium on Optical Testing. Xiamen: Optical Testing Committee of Chinese Optical Society, 2001: 61-64.

    [11] WU Jinguang. Modern Fourier transform infrared spectroscopy technology and its application[M]. Beijing: Scientific and Technical Documents Publishing House, 1994: 251-301.

    [12] BELL R J. Fourier transform spectroscopy[M]//Introductory Fourier transform spectroscopy. Amsterdam: Elsevier, 1972: 1-15.

    [13] International Standardization Organization. Guide to the expression of uncertainty in measurement: JCGM 100: 2008[S]. Switzerland: [s. n. ], 1993: 37-38.

    [14] General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China. Evaluation and Expression of Uncertainty in Measurement: JJF1059.1-2012[S]. Beijing: Standards Press of China, 2012: 18-23.

    Siwei LI, Xuexin WANG, Yi XIE, Yu GUO, Xiaoyu YAN, Yuxin YANG, Xu ZHANG. Spectral transmittance calibration technology of infrared optical system[J]. Journal of Applied Optics, 2023, 44(4): 868
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