Bo LI, Fang WANG, Haowen LYU, Wei WU, Hangxin WEI. Method of microscopic imaging quality evaluation for board lens based on image parameter extraction of pinhole imaging[J]. Journal of Applied Optics, 2021, 42(5): 839

Search by keywords or author
- Journal of Applied Optics
- Vol. 42, Issue 5, 839 (2021)

Fig. 1. Schematic diagram of microscopic imaging system

Fig. 2. MTF extraction method

Fig. 3. Distribution diagram of CMOS image spot

Fig. 4. MTF extraction of spot image

Fig. 5. System imaging model

Fig. 6. Tested board lens

Fig. 7. and
curves of board lens (β =1.5)
镜头
和
曲线(β =1.5)

Fig. 8. and
curves of board lens (β =2.0)
镜头
和
曲线(β =2.0)

Fig. 9. RGB bitmap image of board lens

Fig. 10. Comparison of average power spectrum curves
|
Table 1. Component parameters of test system
|
Table 2. Evaluation parameter values of tested board lens
|
Table 3. Definition evaluation parameters of board lens RGB bitmap images

Set citation alerts for the article
Please enter your email address