[1] Wang Enge. Atomic-scale study of kinetics in film growth (Ⅰ) [J]. Progress in Physics,2003,23(1):1-61
[2] Wang Enge. Atomic-scale study of kinetics in film growth(Ⅱ) [J]. Progress in Physics,2003,23(2):145-191
[3] Qi Hongji,Cheng Chuanfu,Yuan Jingmei et al.. Morphology analysis of titanic thin film prepared by ion beam sputtering[J]. Acta Optica Sinica,2003,23(4):480-484
[4] Yang Xiaodong,Zhang Jingwen,Bi Zhen et al.. XRD analysis ZnO frown by laser molecular beam epitaxy[J]. Acta Photonica Sinica,2008,37(3):485-489
[5] Song Peng,Lu Jiansheng,Zhang Defeng et al.. Finite element method simulation of defects and growth model during metal thin film deposition[J]. Materials Science & Technology,2007,15(6):827-830
[6] Wang Tongtong,Gao Jinsong,Wang Xiaoyi et al.. Preparation of Ge1-xCx thin film by e-gun evaporation assisted with ion source[J]. Acta Photonica Sinica,2007,36(4):715-718
[7] Tong Xinglin,Jiang Desheng,Liu Lian et al.. Characterization of PMN-PT thin film formed by femtosecond pulsed laser deposition[J]. Acta Photonica Sinica,2008,37(3):494-497
[8] Liu Yaodong,Zhao Lei. Preparation of ZnO thin films by pulsed laser deposition[J]. Chinese J. Lasers,2007,34(4):534-537
[9] Wang Yanmin,Meng Haiwei,Wang Yan et al.. Dielectric and optical properties of Ba0.5Sr0.5TiO3 thin films fabricated by pulsed-laser deposition[J]. Acta Optica Sinica,2008,28(4):804-808
[10] E. D. Walsby. Growth and characterisation of birefringent films on textured silicon substrates[J]. Microelectronic Engineering,2005,78-79:436-441
[11] Habib Ammari. Analysis of thin coatings of nonlinear diffraction gratings [J]. Nonlinear Analysis,2002,3(4):487-502
[12] Qi Wang,Dawei Zhang,Hongbo He et al.. Compensation of reflectance response deviations of guided-mode resonant filters induced by over-etched fabrication[J]. Opt. Lett.,2009,34(1):70-72
[13] Dawei Zhang,Limeng Yuan,Jiabi Chen et al.. Design of guided mode resonant filters for authentication applications through azimuthal angles varying[J]. Chin. Opt. Lett.,2008,6(10):776-778
[14] Chen Rongfa. Analysis and study on the capability of aluminium films prepared by electron beam vapour deposition and magnetron sputtering[J]. Vacuum,2003,(2):11-15
