• Journal of Applied Optics
  • Vol. 45, Issue 6, 1138 (2024)
Xiuhua FU1,2, Kaifa REN1,2,*, Ben WANG2, Yonggang PAN2..., Zhaowen LIN2, Jiulin SU2, Suotao DONG2 and Gong ZHANG2|Show fewer author(s)
Author Affiliations
  • 1School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130052, China
  • 2School of Optoelectronic Engineering, Zhongshan Institute of Changchun University of Science and Technology, Zhongshan 528400, China
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    DOI: 10.5768/JAO202445.0601005 Cite this Article
    Xiuhua FU, Kaifa REN, Ben WANG, Yonggang PAN, Zhaowen LIN, Jiulin SU, Suotao DONG, Gong ZHANG. Development of 10 μm~11 μm bandpass filter for surface temperature detection[J]. Journal of Applied Optics, 2024, 45(6): 1138 Copy Citation Text show less
    Spectral distribution curves of blackbody radiation
    Fig. 1. Spectral distribution curves of blackbody radiation
    Transmission spectra of single-layer film
    Fig. 2. Transmission spectra of single-layer film
    Refractive index dispersion distribution of thin-film materials
    Fig. 3. Refractive index dispersion distribution of thin-film materials
    Long-wavelength pass films design
    Fig. 4. Long-wavelength pass films design
    Short-wavelength pass films design
    Fig. 5. Short-wavelength pass films design
    Thickness and sensitivity of long-wavelength pass
    Fig. 6. Thickness and sensitivity of long-wavelength pass
    Thickness and sensitivity of short-wavelength pass
    Fig. 7. Thickness and sensitivity of short-wavelength pass
    Spectral transmittance curve of combined membrane system design
    Fig. 8. Spectral transmittance curve of combined membrane system design
    Design and test spectra of long-wavelength pass films
    Fig. 9. Design and test spectra of long-wavelength pass films
    Design and test spectra of short-wavelength pass films
    Fig. 10. Design and test spectra of short-wavelength pass films
    Geometric diagram of rotary spherical fixture
    Fig. 11. Geometric diagram of rotary spherical fixture
    Relative film thickness distribution of rotary spherical workpiece plate
    Fig. 12. Relative film thickness distribution of rotary spherical workpiece plate
    Film thickness deposition motion trajectory of S-point
    Fig. 13. Film thickness deposition motion trajectory of S-point
    Thickness errors of Ge film of long-wavelength and short-wavelength pass films
    Fig. 14. Thickness errors of Ge film of long-wavelength and short-wavelength pass films
    Relation between monitored and actual thicknesses of ZnS film
    Fig. 15. Relation between monitored and actual thicknesses of ZnS film
    Sample prepared by experiment
    Fig. 16. Sample prepared by experiment
    Measured transmittance curves
    Fig. 17. Measured transmittance curves
    MaterialDensity/ g·cm−3Acoustic impedance/ Pa·s·m−1Refractive indexTransparent wave length/μmYoung's modulus/ GPaLinear expansion coefficient/K
    Ge5.321.38×1074.2(10.5 μm)2~231035.5×10−6
    PbTe8.83.02×1075.0(10.5 μm)1~25542.8×10−7
    Znse5.272.69×1072.41(10.5 μm)2~14677.1×10−6
    ZnS4.091.83×1072.2(10.5 μm)0.38~14977.6×10−6
    YF34.322.06×1071.49(10.5 μm)0.35~121159.2×10−6
    Table 1. Optical and mechanical properties of Ge, PbTe, ZnSe, ZnS and YF3
    ParameterValue/%Wavelength/μm
    Average transmittance Tave99.7310~11
    Top ripple amplitude ∆0.710~11
    Rejection rate K0.0194~9.5
    0.03111.5~16
    Table 2. Designed optical properties of bandpass filter film
    NameBeamE/B/%Gas Ar/sccm
    Voltage/VCurrent/mA
    Cleaning2003 0001508
    Ge1505002006
    ZnS1205002006
    Table 3. Ion source process parameters
    MaterialSubstrate temperature/℃Degree of vacuum /PaDeposition rate/(nm/s)
    Ge1504.0×10−40.5
    ZnS1504.0×10−42.5
    Table 4. Deposition process parameters of Ge and ZnS films
    NumberFilmDesign thickness /nmFilm thickness on the crystal oscillator/nmDrop height of liquid level d/mmError value of film thickness/ nm
    1Ge475.15703.602.75+0.273
    3Ge240.68356.401.39+0.342
    5Ge416.67682.772.67+1.03
    Table 5. Thickness errors at S-point position of Ge films
    Monitor thickness X/nmActual thicknessY/nm
    200134.5
    400273.1
    600409.6
    800550.2
    1 000687.5
    1 200824.2
    Table 6. Correspondence between monitored and actual thicknesses of ZnS film
    ParameterWavelength/μmValue/%
    Average transmittance Tave10~1194.3
    Top ripple amplitude 10~111.6
    Rejection rate K4~9.5<0.1
    11.5~16<0.1
    Table 7. Spectrum test results
    Xiuhua FU, Kaifa REN, Ben WANG, Yonggang PAN, Zhaowen LIN, Jiulin SU, Suotao DONG, Gong ZHANG. Development of 10 μm~11 μm bandpass filter for surface temperature detection[J]. Journal of Applied Optics, 2024, 45(6): 1138
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