Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)

Guadalupe López-Morales; Victor-Manuel Rico-Botero; Rafael Espinosa-Luna; Qiwen Zhan

doi:10.3788/COL201715.030004

Journals >Chinese Optics Letters >Volume 15 >Issue 3 >Page 030004 > Article

Chinese Optics Letters
Vol. 15, Issue 3, 030004 (2017)

Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)

Guadalupe López-Morales^1、*, Victor-Manuel Rico-Botero¹, Rafael Espinosa-Luna¹, and Qiwen Zhan²

Author Affiliations

¹GIPYS Laboratory, Centro de Investigaciones en Óptica, A. C., León, Gto 37150, México

²Department of Electro-Optics and Photonics, University of Dayton, Dayton, OH 45469, USA

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DOI: 10.3788/COL201715.030004 Cite this Article Set citation alerts

Guadalupe López-Morales, Victor-Manuel Rico-Botero, Rafael Espinosa-Luna, Qiwen Zhan. Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)[J]. Chinese Optics Letters, 2017, 15(3): 030004 Copy Citation Text

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