• Acta Physica Sinica
  • Vol. 69, Issue 4, 047401-1 (2020)
Ruo-Zhou Zhang1、2, Ming-Yang Qin1、2, Lu Zhang3, Li-Xing You3, Chao Dong4, Peng Sha4, Jie Yuan1, and Kui Jin1、2、5、*
Author Affiliations
  • 1Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
  • 2School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
  • 4Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
  • 5Songshan Lake Materials Laboratory, Dongguan 523808, China
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    DOI: 10.7498/aps.69.20191758 Cite this Article
    Ruo-Zhou Zhang, Ming-Yang Qin, Lu Zhang, Li-Xing You, Chao Dong, Peng Sha, Jie Yuan, Kui Jin. Measurement of magnetic penetration depth in superconducting films by two-coil mutual inductance technique[J]. Acta Physica Sinica, 2020, 69(4): 047401-1 Copy Citation Text show less
    Schematic illustration (a) and equivalent circuit (b) of the two-coil mutual inductance apparatus.
    Fig. 1. Schematic illustration (a) and equivalent circuit (b) of the two-coil mutual inductance apparatus.
    (a) The mutual inductance as a function of film radii R calculated for the typical superconducting film with d = 100 nm, λ = 150 nm; (b) calculations of penetration depth λcal vs film radii R for different spacings between two coils (h = 0.9, 4.5, 9.0 mm). The real penetration depth (λ = 150 nm) is indicated by the dotted line.
    Fig. 2. (a) The mutual inductance as a function of film radii R calculated for the typical superconducting film with d = 100 nm, λ = 150 nm; (b) calculations of penetration depth λcal vs film radii R for different spacings between two coils (h = 0.9, 4.5, 9.0 mm). The real penetration depth (λ = 150 nm) is indicated by the dotted line.
    (a) The induced voltage data Vx, 1(T) and Vx, 2(T) taken from the same Nb film with sample remounted; (b) the frequency dependence of induced voltage V(T = 4.5 K) for the Nb film.
    Fig. 3. (a) The induced voltage data Vx, 1(T) and Vx, 2(T) taken from the same Nb film with sample remounted; (b) the frequency dependence of induced voltage V(T = 4.5 K) for the Nb film.
    Two-coil mutual inductance measurement results of NbN films (NbN#1, NbN#2, NbN#3, NbN#4): (a) Temperature dependence of induced voltage Vx(T) and Vy(T) for NbN#1; (b) temperature-dependent penetration depth λ(T) of four NbN films; (c) temperature variation in superfluid density for NbN#1. The black line shows the dirty s-wave BCS theory fit to the data; (d) the value of λ(T→ 0) for four NbN films, which shows a good agreement with the published value[38]. The length of error bar is shorter than the symbol size.
    Fig. 4. Two-coil mutual inductance measurement results of NbN films (NbN#1, NbN#2, NbN#3, NbN#4): (a) Temperature dependence of induced voltage Vx(T) and Vy(T) for NbN#1; (b) temperature-dependent penetration depth λ(T) of four NbN films; (c) temperature variation in superfluid density for NbN#1. The black line shows the dirty s-wave BCS theory fit to the data; (d) the value of λ(T→ 0) for four NbN films, which shows a good agreement with the published value[38]. The length of error bar is shorter than the symbol size.
    Ruo-Zhou Zhang, Ming-Yang Qin, Lu Zhang, Li-Xing You, Chao Dong, Peng Sha, Jie Yuan, Kui Jin. Measurement of magnetic penetration depth in superconducting films by two-coil mutual inductance technique[J]. Acta Physica Sinica, 2020, 69(4): 047401-1
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