• Optoelectronics Letters
  • Vol. 17, Issue 8, 464 (2021)
Lingmao XU1, Yanchun HE1, Kun LI1, Hui ZHOU1、*, Ying WANG2, Yuqing XIONG1, and Shuwu DAI2
Author Affiliations
  • 1Science and Technology on Vacuum Technology and Physics Laboratory, Lanzhou Institute of Physics, Lanzhou 730001, China
  • 2Beijing Institute of Spacecraft System Engineering, Beijing 100094, China
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    DOI: 10.1007/s11801-021-0157-8 Cite this Article
    XU Lingmao, HE Yanchun, LI Kun, ZHOU Hui, WANG Ying, XIONG Yuqing, DAI Shuwu. Optical properties of Ta2O5 single layer and ultraviolet reflective film under ultraviolet irradiation[J]. Optoelectronics Letters, 2021, 17(8): 464 Copy Citation Text show less
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    XU Lingmao, HE Yanchun, LI Kun, ZHOU Hui, WANG Ying, XIONG Yuqing, DAI Shuwu. Optical properties of Ta2O5 single layer and ultraviolet reflective film under ultraviolet irradiation[J]. Optoelectronics Letters, 2021, 17(8): 464
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