• Journal of Infrared and Millimeter Waves
  • Vol. 38, Issue 5, 549 (2019)
WU Jia1、2, XU Zhi-Cheng1, CHEN Jian-Xin1、*, and HE Li1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.11972/j.issn.1001-9014.2019.05.001 Cite this Article
    WU Jia, XU Zhi-Cheng, CHEN Jian-Xin, HE Li. Wet etching for InAs-based InAs/Ga(As)Sb superlattice long wavelength infrared detectors[J]. Journal of Infrared and Millimeter Waves, 2019, 38(5): 549 Copy Citation Text show less

    Abstract

    Wet chemical etching of InAs-based InAs/Ga(As)Sb superlattice long wavelength infrared photodiodes was studied in this paper.The etching experiments using citric acid,orthophosphoric acid and hydrogen peroxidewere carried out on InAs,GaSb bulk materials and InAs/Ga(As)Sb superlattices with different solution ratios. An optimized etching solution for the InAs-based superlattices has been obtained. The etched surface roughness is only 1 nm. InAs-based superlattice LWIR detectors with 50 % cut-off wavelength of 12 μm were fabricated. The photodetectors etched with optimized solution ratio show low surface leakage characteristic.At 81 K temperature, the surface resistivity ρSurface of the detector is 4. 4 × 103 Ωcm.
    WU Jia, XU Zhi-Cheng, CHEN Jian-Xin, HE Li. Wet etching for InAs-based InAs/Ga(As)Sb superlattice long wavelength infrared detectors[J]. Journal of Infrared and Millimeter Waves, 2019, 38(5): 549
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