• Acta Photonica Sinica
  • Vol. 41, Issue 8, 922 (2012)
LIN Jian-ping1、*, LIN Li-mei2, GUAN Gui-qing1, WU Yang-wei2, and LAI Fa-chun2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/gzxb20124108.0922 Cite this Article
    LIN Jian-ping, LIN Li-mei, GUAN Gui-qing, WU Yang-wei, LAI Fa-chun. Structural, Optical and Electrical Properties of Chromium Thin Films Prepared by Magnetron Sputtering[J]. Acta Photonica Sinica, 2012, 41(8): 922 Copy Citation Text show less
    References

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    [14] LAI Fa-chun, LIN Li-mei, HUANG Zhi-gao, et al. Effect of thickness on the structure, morphology and optical properties of sputter deposited Nb2O5 films[J]. Applied Surface Science, 2006, 253(4): 1801-1805.

    [15] LAI Fa-chun, LIN Li-mei, GAI Rong-quan, et al. Determination of optical constants and thicknesses of In2O3:Sn films from transmittance data[J]. Thin Solid Films, 2007, 515(18): 7387-7392.

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    LIN Jian-ping, LIN Li-mei, GUAN Gui-qing, WU Yang-wei, LAI Fa-chun. Structural, Optical and Electrical Properties of Chromium Thin Films Prepared by Magnetron Sputtering[J]. Acta Photonica Sinica, 2012, 41(8): 922
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