• Opto-Electronic Engineering
  • Vol. 32, Issue 7, 52 (2005)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New photoelectric collimation method for measuring the code-bar grade rod[J]. Opto-Electronic Engineering, 2005, 32(7): 52 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New photoelectric collimation method for measuring the code-bar grade rod[J]. Opto-Electronic Engineering, 2005, 32(7): 52
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