• INFRARED
  • Vol. 42, Issue 1, 1 (2021)
Shao-jie XIA and Jun CHEN*
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1672-8785.2021.01.001 Cite this Article
    XIA Shao-jie, CHEN Jun. Research on Current and Capacitance Characteristics of p-i-n InP/InGaAs Photodetector[J]. INFRARED, 2021, 42(1): 1 Copy Citation Text show less
    References

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    [6] Xia H, Li T X, Tang H J, et al. Nanoscale Imaging of the Photoresponse in PN Junctions of InGaAs Infrared Detector[J]. Scientific Reports, 2016, 6: 21544.

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    [11] Bauer J G, Albrecht H, Hoffmann L, et al. Lo-cally Ion-implanted JFET in an InGaAs/InP pin Photodiode Layer Structure for a Monolithically Planar Integrated Receiver OEIC[J]. IEEE Photonics Technology Letter, 1992, 4(3): 253255.

    [12] Zang J Z, Morgan J S, Xie X J, et al. InP/InGaAs Photovaractor[J]. Journal of Lightwave Technology, 2018, 36(9): 16611665.

    [13] ATLAS User′s Manual[M]. Santa Clara: Silvaco International, 2015.

    [14] Wang Y D, Chen J, Xu J T, et al. Modeling of Frequency-dependent Negative Differential Capacitance in InGaAs/InP Photodiode[J]. Infrared Physics and Technology, 2018, 89: 4145.

    CLP Journals

    [1] Linhua Gao, Yanxia Cui, Qiangbing Liang, Yanzhen Liu, Guohui Li, Mingming Fan, Yuying Hao. Research progress in metal-inorganic semiconductor-metal photodetectors[J]. Infrared and Laser Engineering, 2020, 49(8): 20201025

    XIA Shao-jie, CHEN Jun. Research on Current and Capacitance Characteristics of p-i-n InP/InGaAs Photodetector[J]. INFRARED, 2021, 42(1): 1
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