Erasing of the Free Induction Decay by Incoherent Ionization Injection

Haicheng MEI; Xiang ZHANG; Santiago LÓPEZ; Qi LU; Siyu QIN; Liang XU; Eduardo OLIVA; Yi LIU

doi:10.3788/gzxb20235204.0414001

Journals >Acta Photonica Sinica >Volume 52 >Issue 4 >Page 0414001 > Article

Acta Photonica Sinica
Vol. 52, Issue 4, 0414001 (2023)

Erasing of the Free Induction Decay by Incoherent Ionization Injection

Haicheng MEI¹, Xiang ZHANG¹, Santiago LÓPEZ^2、3, Qi LU¹, Siyu QIN¹, Liang XU¹, Eduardo OLIVA^2、3, and Yi LIU^1、*

Author Affiliations

¹Shanghai Key Lab of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China

²Departamento de Ingeniería Energética, ETSI Industriales, Universidad Politécnica de Madrid, 28006Madrid, Spain

³Instituto de Fusión Nuclear, Universidad Politécnica de Madrid, Madrid 28006, Spain

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DOI: 10.3788/gzxb20235204.0414001 Cite this Article

Haicheng MEI, Xiang ZHANG, Santiago LÓPEZ, Qi LU, Siyu QIN, Liang XU, Eduardo OLIVA, Yi LIU. Erasing of the Free Induction Decay by Incoherent Ionization Injection[J]. Acta Photonica Sinica, 2023, 52(4): 0414001 Copy Citation Text

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Fig. 1. Experimental setup. Inset，energy-level diagram of neutral and ionic nitrogen molecule

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Fig. 2. Spectrum of the forward emission as a function of the pump laser wavelength

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Fig. 3. Suppression of the emission obtained at different pump wavelength

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Fig. 4. Experimental results of 1 250 nm pump wavelength

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Fig. 5. Experimental results of 1 550 nm pump wavelength

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Fig. 6. Results of the 1D Maxwell-Bloch modelling

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