• Optics and Precision Engineering
  • Vol. 18, Issue 11, 2375 (2010)
GUO Liang1,2,*, WU Qing-wen1, YAN Chang-xiang1, LIU Ju1..., CHEN Li-heng1 and PIAO Ren-guan1|Show fewer author(s)
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    DOI: Cite this Article
    GUO Liang, WU Qing-wen, YAN Chang-xiang, LIU Ju, CHEN Li-heng, PIAO Ren-guan. Thermal analysis and verification of CCD components in spectral imagers at steady and transient states[J]. Optics and Precision Engineering, 2010, 18(11): 2375 Copy Citation Text show less
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    [2] PAN X K, YU J Z, GAO H X. Steady state and transient thermal analysis of airborne electronic components [J]. Electro-Mechanical Engineering, 2005,21(1):22-28. (in Chinese)

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    [5] GUO L, WU Q W. Thermal design and proof tests of CCD components in spectral imagers [J]. Opt. Precision Eng., 2009,17(10):2440-2444. (in Chinese).

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    GUO Liang, WU Qing-wen, YAN Chang-xiang, LIU Ju, CHEN Li-heng, PIAO Ren-guan. Thermal analysis and verification of CCD components in spectral imagers at steady and transient states[J]. Optics and Precision Engineering, 2010, 18(11): 2375
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