DAI Shaosheng, MAO Xinghua, YU Zian. Pavement Crack Feature Extraction Based on Image Processing[J]. Semiconductor Optoelectronics, 2024, 45(3): 508

Search by keywords or author
- Semiconductor Optoelectronics
- Vol. 45, Issue 3, 508 (2024)
Abstract

Set citation alerts for the article
Please enter your email address