• Infrared Technology
  • Vol. 44, Issue 8, 798 (2022)
Jiansen GAO1、* and Jian LIU2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    GAO Jiansen, LIU Jian. Characteristics of Photovoltage Spectrum on Surfaces of Gallium Nitride Photocathode Film Materials[J]. Infrared Technology, 2022, 44(8): 798 Copy Citation Text show less
    References

    [1] WANG X H, ZHANG Y J. Negative electron affinity GaN photocathode with Mg delta-doping[J]. Optik, 2018, 168: 278-281.

    [2] CUI Z, LI E, KE X, et al. Adsorption of alkali-metal atoms on GaN nanowires photocathode[J]. Applied Surface Science, 2017, 423: 829-835.

    [3] XIA S H, LIU L, DIAO Y, et al. Research on quantum efficiency and photoemission characteristics of exponential-doping GaN nanowire photocathode[J]. Journal of Materials Science, 2017, 52(21): 12795-12805.

    [8] LIU Q, CHEN C, Ruda H. Surface photovoltage in undoped semi-insulating GaAs[J]. Journal of Applied Physics, 1993, 74(12): 7492-7496.

    [9] Kronik L, Shapira Y. Surface photovoltage phenomena: theory, experiment, and applications[J]. Surface Science Reports, 1999, 37(1-5): 1-206.

    [10] Olafsson H ., Gudmundsson J T, Svavarsson H G, et al. Hydrogen passivation of AlxGa1.xAs/GaAs studied by surface photovoltage spectroscopy[J]. Physica B: Condensed Matter, 1999, 273: 689-692.

    [11] Foussekis M, Ferguson J D, Baski A A, et al. Role of the surface in the electrical and optical properties of GaN[J]. Physica B Condensed Matter, 2009, 404(23-24): 4892-4895.

    [13] ZHANG Q, WANG D, WEI X, et al. A study of the interface and the related electronic properties in n-Al0.35Ga0.65N/GaN heterostructure[J]. Thin Solid Films, 2005, 491: 242-248.

    [15] Sharma T K, Porwal S, Kumar R, et al. Absorption edge determination of thick GaAs wafers using surface photovoltage spectroscopy[J]. Review of Scientific Instruments, 2002, 73(4): 1835-1840.

    [16] Jana D, Porwal S, Sharma T K, et al. Pump-probe surface photovoltage spectroscopy measurements on semiconductor epitaxial layers[J]. Review of Scientific Instruments, 2014, 85(4): 1-21.

    [18] Schwarz R, Slobodin D, Wagner S. Differential surface photovoltage measurement of minority‐carrier diffusion length in thin films[J]. Applied Physics Letters, 1985, 47(7):740-742.

    [19] Chow T P, Ghezzo. SiC power devices. In III-Nitride, SiC, and diamond materials for electronic devices[J]. Material Research Society Symposium Proceedings, Gaskill D K, Brandt C D, Nemanich R J Eds, Pittsburgh, PA. 1996, 423: 69-73.

    [20] Park H Y, Jeon K N, Kim K J. Mg Delta-doping effect on a deep hole center related to electrical activation of a p-type GaN thin film[J]. Transactions on Electrical & Electronic Materials, 2010, 11(1): 37-41.

    [21] Liliental W Z, Benamara M, Swider W, et al. Ordering in bulk GaN:Mg samples: defects caused by Mg doping[J]. Physica B Condensed Matter, 1999, 273-274(3): 124-129.

    GAO Jiansen, LIU Jian. Characteristics of Photovoltage Spectrum on Surfaces of Gallium Nitride Photocathode Film Materials[J]. Infrared Technology, 2022, 44(8): 798
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