• Infrared and Laser Engineering
  • Vol. 47, Issue 9, 917003 (2018)
Wang Jing1, Zhang Wenhai1, Yang Guohong1, Wei Minxi1, and Zheng Lei2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/irla201847.0917003 Cite this Article
    Wang Jing, Zhang Wenhai, Yang Guohong, Wei Minxi, Zheng Lei. Detection efficiency calibraion of CsI(TI) scintillator with 2 000-2 800 eV soft X-ray incidence[J]. Infrared and Laser Engineering, 2018, 47(9): 917003 Copy Citation Text show less

    Abstract

    CsI(Tl) scintillator is a key part for the transition from X-ray to visible light, its transition efficiency is of crucial importance in X-ray diagnosis for inertial confined fusion. X-rays could deposit energies into the CsI(Tl) scintillator and visible lights were emitted. The detection efficiency of CsI(Tl) scintillator with different thickness was calibrated on the beamline 4B7A at Beijing Synchrotron Radiation Facility in the energy range between 2 000 eV and 2 800 eV. Energy deposition and energy response with the stimulation of X-ray were studied. The whole system included emitting X-ray, standard detector, shutter, CsI(Tl) scintillator, black box and SI1000 CCD. Emitting X-ray was normalized with curve fitting. SI1000 CCD was used to receive the visible light which the counts were kept in the linearity range of CCD. The experiment gets the detector current, CCD counts, the ratio of CCD counts and emitting X-ray counts in the energy region from 2 000 eV to 2 800 eV. The results show the detection efficiency increase with the increase of the thickness of CsI(Tl) scintillator. The experimental method makes foundation for the subsequent selection of a suitable thickness of scintillator of soft X-ray detection.
    Wang Jing, Zhang Wenhai, Yang Guohong, Wei Minxi, Zheng Lei. Detection efficiency calibraion of CsI(TI) scintillator with 2 000-2 800 eV soft X-ray incidence[J]. Infrared and Laser Engineering, 2018, 47(9): 917003
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