• Chinese Journal of Lasers
  • Vol. 32, Issue 5, 663 (2005)
[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Auto-Alignment of Polarizer and Analyzer and Error Analysis in Fourier Magneto-Optic Spectrometry[J]. Chinese Journal of Lasers, 2005, 32(5): 663 Copy Citation Text show less
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    [5] R. M. Esquerra, R. A. Goldbeck, D. B. Kim-Shapiro et al.. Fast time-resolved magnetic optical rotatory dispersion measurements. 1. Mueller analysis of optical and photoselection-induced artifacts[J]. J. Phys. Chem. A, 1998, 102(45): 8740~8748

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    [8] H. T. Minden. Transverse Kerr magneto-optic measurements with a rotating analyzer ellipsometer[J]. Rev. Sci. Instrum., 1992, 63(6): 3290~3292

    [9] M. Mansuripur, F. Zhou, J.K. Erwin. Measuring the wavelength dependence of magnetooptical Kerr (or Faraday) rotation and ellipticity: a technique[J]. Appl. Opt., 1990, 29(9): 1308~1312

    [10] Xiao-song Zhu, Hai-bing Zhao, Peng Zhou et al.. A method to measure the two-dimensional image of magneto-optical Kerr effect[J]. Rev. Sci. Instrum., 2003, 74(11): 4718~4722

    [12] S. Kawabata. Improved measurement method in rotating-analyzer ellipsometry[J]. J. Opt. Soc. Am. A, 1984, 1(7): 706~710

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Auto-Alignment of Polarizer and Analyzer and Error Analysis in Fourier Magneto-Optic Spectrometry[J]. Chinese Journal of Lasers, 2005, 32(5): 663
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