[1] SWANEPOEL R. Determination of the thickness and optical constants of amorphous silicon [J].J Phys E: Sci Instrum, 1983, 16: 1214-1222.
[3] WEMPLE S H AND DIDOMENICO M, Optical dispersion and the structure of solids [J].Phys Rev Letters, 1969, 23: 1156-1160.
[4] WEMPLE S H AND DIDOMENICO M, Behavior of the electronic dielectric constant in covalent and ionic Materials [J].Phys Rev B, 1971, 3: 1338-1350.
[5] TIAN Min-bo, LIU De-ling. Hand book of thin film science and technology [M].Beijing:China Machine Press, 1991:107.
[6] WEMPLE S H. Refractive-index behavior of amorphous semiconductors and glasses [J].Phys Rev B, 1971, 7: 3767-3777.