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    Journals >Infrared Technology >Volume 43 >Issue 11 >Page 1089 > Article
    • Infrared Technology
    • Vol. 43, Issue 11, 1089 (2021)
    Application of Improved Wavelet Threshold in Infrared Thermal Wave Nondestructive Testing
    Lanlin ZOU* and Nianqiong LI
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    ZOU Lanlin, LI Nianqiong. Application of Improved Wavelet Threshold in Infrared Thermal Wave Nondestructive Testing[J]. Infrared Technology, 2021, 43(11): 1089 Copy Citation Text show less
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    ZOU Lanlin, LI Nianqiong. Application of Improved Wavelet Threshold in Infrared Thermal Wave Nondestructive Testing[J]. Infrared Technology, 2021, 43(11): 1089
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