• Acta Photonica Sinica
  • Vol. 51, Issue 8, 0851506 (2022)
Peng GAO, Xiang FANG, Kai WEN, Yunze LEI, Zihan XIONG, Jiaoyue LI, Xing LIU, Juanjuan ZHENG, and Sha AN
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  • [in Chinese]
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    DOI: 10.3788/gzxb20225108.0851506 Cite this Article
    Peng GAO, Xiang FANG, Kai WEN, Yunze LEI, Zihan XIONG, Jiaoyue LI, Xing LIU, Juanjuan ZHENG, Sha AN. Large-field Structured Illumination Microscopy(Invited)[J]. Acta Photonica Sinica, 2022, 51(8): 0851506 Copy Citation Text show less

    Abstract

    The proposed method also has disadvantages: first, the period of the fringe/lattice patterns can not be varied digitally like what in SLM/DMD-based SIM. Second, the resolution enhancement achieved with this method is less isotropic than the standard 3-angle 2-beam SIM. Both drawbacks can be solved by using a specially-designed Diffractive Optical Element (DOE) instead of the 2D grating used in the current technique and by recording more raw images under different phase-shift combinations. Once using a 2D amplitude grating that has the same transmittance for different illumination wavelengths, the large-field SIM also allows multi-color SIM imaging. We can envisage that the proposed method can be applied to many fields, including biomedical, industrial, and chemical fields.
    Peng GAO, Xiang FANG, Kai WEN, Yunze LEI, Zihan XIONG, Jiaoyue LI, Xing LIU, Juanjuan ZHENG, Sha AN. Large-field Structured Illumination Microscopy(Invited)[J]. Acta Photonica Sinica, 2022, 51(8): 0851506
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