Surface characterization of ICF capsule by AFM-based profilometer

Jie Meng; Xuesen Zhao; Xing Tang; Yihao Xia; Xiaojun Ma; Dangzhong Gao

doi:10.1017/hpl.2017.20

Journals >High Power Laser Science and Engineering >Volume 5 >Issue 3 >Page 03000e21 > Article

High Power Laser Science and Engineering
Vol. 5, Issue 3, 03000e21 (2017)

Surface characterization of ICF capsule by AFM-based profilometer

Jie Meng¹, Xuesen Zhao², Xing Tang¹, Yihao Xia¹, Xiaojun Ma¹, and Dangzhong Gao^1、†

Author Affiliations

¹Research Center of Laser Fusion, CAEP, Mianyang 621000, PR China

²P.O.Box 413, Harbin Institute of Technology, Harbin 150001, PR China

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DOI: 10.1017/hpl.2017.20 Cite this Article Set citation alerts

Jie Meng, Xuesen Zhao, Xing Tang, Yihao Xia, Xiaojun Ma, Dangzhong Gao. Surface characterization of ICF capsule by AFM-based profilometer[J]. High Power Laser Science and Engineering, 2017, 5(3): 03000e21 Copy Citation Text

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