Research on Low Noise Automatic Testing Technology of Infrared Detector

Jian-wei LIU; Yan-lei XING; Guang-le YAO

doi:10.3969/j.issn.1672-8785.2020.07.002

Journals >INFRARED >Volume 41 >Issue 7 >Page 5 > Article

INFRARED
Vol. 41, Issue 7, 5 (2020)

Research on Low Noise Automatic Testing Technology of Infrared Detector

Jian-wei LIU, Yan-lei XING, and Guang-le YAO

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[in Chinese]

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DOI: 10.3969/j.issn.1672-8785.2020.07.002 Cite this Article

LIU Jian-wei, XING Yan-lei, YAO Guang-le. Research on Low Noise Automatic Testing Technology of Infrared Detector[J]. INFRARED, 2020, 41(7): 5 Copy Citation Text

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References

[2] Henry W O. Noise Reduction Techniques In Electronic Systems [M].Whippany: Wiley-Interscience, 2008.

LIU Jian-wei, XING Yan-lei, YAO Guang-le. Research on Low Noise Automatic Testing Technology of Infrared Detector[J]. INFRARED, 2020, 41(7): 5

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