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    Journals >INFRARED >Volume 41 >Issue 7 >Page 5 > Article
    • INFRARED
    • Vol. 41, Issue 7, 5 (2020)
    Research on Low Noise Automatic Testing Technology of Infrared Detector
    Jian-wei LIU, Yan-lei XING, and Guang-le YAO
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    DOI: 10.3969/j.issn.1672-8785.2020.07.002 Cite this Article
    LIU Jian-wei, XING Yan-lei, YAO Guang-le. Research on Low Noise Automatic Testing Technology of Infrared Detector[J]. INFRARED, 2020, 41(7): 5 Copy Citation Text show less
    References

    [2] Henry W O. Noise Reduction Techniques In Electronic Systems [M].Whippany: Wiley-Interscience, 2008.

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    LIU Jian-wei, XING Yan-lei, YAO Guang-le. Research on Low Noise Automatic Testing Technology of Infrared Detector[J]. INFRARED, 2020, 41(7): 5
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