Journals
Advanced Photonics
Photonics Insights
Advanced Photonics Nexus
Photonics Research
Advanced Imaging
View All Journals
Chinese Optics Letters
High Power Laser Science and Engineering
Articles
Optics
Physics
Geography
View All Subjects
Conferences
CIOP
HPLSE
AP
View All Events
News
About CLP
Search by keywords or author
Login
Registration
Login in
Registration
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
metasurface
LASER
NIR
optical coherence tomography
Lithium niobate
OAM
Journals >
Chinese Journal of Lasers >
Volume 45 >
Issue 12 >
Page 1204001 > Article
Chinese Journal of Lasers
Vol. 45, Issue 12, 1204001 (2018)
Collinear Autocorrelation Measurement of Ultrashort Laser Pulse Based on Michelson Interferometer
Wei He
1、*
, Minghuan Cui
1
, Didi Song
1
, Chaochao Qin
1
, and Yuhai Jiang
2
Author Affiliations
1
College of Physics and Material Science, Henan Normal University, Xinxiang, Henan 453000, China
2
Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China
show less
DOI:
10.3788/CJL201845.1204001
Cite this Article
Set citation alerts
Wei He, Minghuan Cui, Didi Song, Chaochao Qin, Yuhai Jiang. Collinear Autocorrelation Measurement of Ultrashort Laser Pulse Based on Michelson Interferometer[J]. Chinese Journal of Lasers, 2018, 45(12): 1204001
Copy Citation Text
EndNote(RIS)
BibTex
Plain Text
show less
Cited By
Article index updated: Jun. 3, 2024
Citation counts are provided from Researching.
The article is cited by
3
article(s) from Researching.
Abstract
Get PDF(in Chinese)
Figures&Tables (4)
Equations (0)
References (0)
Cited By (3)
Get Citation
Copy Citation Text
Wei He, Minghuan Cui, Didi Song, Chaochao Qin, Yuhai Jiang. Collinear Autocorrelation Measurement of Ultrashort Laser Pulse Based on Michelson Interferometer[J]. Chinese Journal of Lasers, 2018, 45(12): 1204001
Download Citation
EndNote(RIS)
BibTex
Plain Text
Set citation alerts for the article
Tools
Share
Set citation alerts for the article
Save the article for my favorites
Paper Information
Category: measurement and metrology
Received: Jun. 8, 2018
Accepted: Jul. 30, 2018
Published Online: Dec. 15, 2018
The Author Email:
DOI:
10.3788/CJL201845.1204001
Recommended Topics
laser devices and laser physics
Lasers and Laser Optics
Laser physics
laser manufacturing
Instrumentation, Measurement and Metrology
Set citation alerts for the article
Please enter your email address
Cancel
Confirm