[1] SCHMITT Dirk-Roger. Characterization of mirror surfaces for laser-gyro applications[C]. SPIE, 1988, 1009: 155-164.
[2] SKELDON K D, MACKINTOSH J, GRADOWSKI M V, et al. Qualification of supermirrors for ring-laser-gyros based on surface roughness and scatter measurements[J]. J Opt A: Pure Appl Opt, 2001, 3(3): 183-187.
[3] KIENZLE O, STAUB J, TSCHUDI T. Light scattering from transparent substrates: Theory and experiment[J]. Physical Review B, 1994, 50(3): 1848-1860.
[4] GUENTHER K H, WIERER P G, BENNETT J M. Surface roughness measurements of low-scatter mirrors and roughness standards[J]. Applied Optics, 1984, 23(21): 3820-3836.
[5] ANGELA D, JOSEP F B, STEFAN G, et al. Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components[J]. Applied Optics, 2002, 41(1): 154-171.
[7] MATTSSON, LARS H. Characterization of supers mooth surfaces by light scattering techniques[C].//BENNETT J M. Surface Measurement and Characterization SPIE, 1988, 1009: 165-171.
[8] KIENZLE O, STAUB J, TSCHUDI T. Description of an integrated scatter instrument for measuring scatter losses of ‘superpolished’ optical surfaces[J]. Meas Sci Technol, 1994, 5(6): 747-752.
[9] KIENZLE O, SCHEUER V, STAUB J, et al. Design of an integrated scatter instrument for measuring scatter losses of superpolished optical surfaces,application to surface characterization of transparent fused quartz substrates[C]. SPIE, 1994, 2253: 1131-1142.
[10] ZERRAD M, DEUMIE C, LEQUIME M, et al. Light-scattering characterization of transparent substrates[J]. Applied Optics, 2006, 45(7): 1402-1409.
[11] HOU Hai-hong, YI Kui, ZHANG Shu-zhen, et al. Measurement of light scattering from glass substrates by total integrated scattering[J]. Applied Optics, 2005, 44(29): 6163-6166.
[12] TRUCKENBRODT H, DUPARRE A, SCHUHMANN U. Roughness and defect characterization of optical surfaces by light scattering measurements[C]. SPIE, 1992, 1781: 139-151.
[13] LINDSTROEM T, ROENNOW D. Total integrated scattering from transparent substrates in the infrared region: Validity of scalar theory[J]. Opt Eng, 2000, 39(2): 478-487.