• Optics and Precision Engineering
  • Vol. 30, Issue 19, 2362 (2022)
Yang ZHAO1,* and Qiangxian HUANG2
Author Affiliations
  • 1School of Electronic and Information Engineering, Anhui Jianzhu University, Hefei23060, China
  • 2School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei30009, China
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    DOI: 10.37188/OPE.20223019.2362 Cite this Article
    Yang ZHAO, Qiangxian HUANG. Effect of air squeeze film damping in multi-mode atomic force microscopy[J]. Optics and Precision Engineering, 2022, 30(19): 2362 Copy Citation Text show less
    Schematic of simplified cantilever and sample model
    Fig. 1. Schematic of simplified cantilever and sample model
    Functional block diagram of multi-mode AFM
    Fig. 2. Functional block diagram of multi-mode AFM
    Head and base of multi-mode AFM system
    Fig. 3. Head and base of multi-mode AFM system
    Approach curves of 0.2 N/m cantilever
    Fig. 4. Approach curves of 0.2 N/m cantilever
    Approach curves of 3 N/m cantilever in fundamental resonance mode
    Fig. 5. Approach curves of 3 N/m cantilever in fundamental resonance mode
    Approach curve of 3 N/m cantilever in second-order resonant mode
    Fig. 6. Approach curve of 3 N/m cantilever in second-order resonant mode
    Serial numberVoltage of theinner wall/VVoltage of theouter wall/V

    Q

    (the first-order resonant mode)

    Q

    (the second-order resonant mode)

    Distance between the tip and the sample/μm
    10120169.62537.712.00
    2080170.02537.872.14
    3040170.36537.792.48
    400176.34537.813.03
    50-40179.92537.793.44
    60-80181.13537.623.86
    70-120184.02537.804.42
    80-160185.75537.545.20
    90-198189.23537.125.93
    1040-198190.17536.586.74
    1180-198192.43536.877.57
    12120-198194.77537.568.40
    13160-198195.27537.279.05
    14198-198197.17536.9210.0
    15下方无试样206.82537.88≫20
    Table 1. Test data of quality factor with squeeze film damping
    Yang ZHAO, Qiangxian HUANG. Effect of air squeeze film damping in multi-mode atomic force microscopy[J]. Optics and Precision Engineering, 2022, 30(19): 2362
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