Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry

Hui Xue; Weidong Shen; Peifu Gu; Zhenyue Luo; Yueguang Zhang; Xu Liu

doi:10.3788/COL20090705.0446

Journals >Chinese Optics Letters >Volume 7 >Issue 5 >Page 05446 > Article

Chinese Optics Letters
Vol. 7, Issue 5, 05446 (2009)

Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry

Hui Xue, Weidong Shen, Peifu Gu, Zhenyue Luo, Yueguang Zhang, and Xu Liu

Author Affiliations

State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, ChinaE-mail: xuehui1223@126.com

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DOI: 10.3788/COL20090705.0446 Cite this Article Set citation alerts

Hui Xue, Weidong Shen, Peifu Gu, Zhenyue Luo, Yueguang Zhang, Xu Liu. Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry[J]. Chinese Optics Letters, 2009, 7(5): 05446 Copy Citation Text

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