• Chinese Journal of Lasers
  • Vol. 39, Issue 8, 807002 (2012)
Chang Yanhe1、2、*, Jin Chunshui1, Li Chun1, and Jin Jingcheng1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/cjl201239.0807002 Cite this Article Set citation alerts
    Chang Yanhe, Jin Chunshui, Li Chun, Jin Jingcheng. Characterization of Optical Constants of Ultraviolet LaF3 Films by Thermal Evaporation[J]. Chinese Journal of Lasers, 2012, 39(8): 807002 Copy Citation Text show less

    Abstract

    To obtain the precise optical constants of thin films, LaF3 thin films of different thickness are deposited by Mo-boat evaporation on fused silica (JGS1). A model for extracting the optical constants of weak absorbing film is applied, which is based on spectrophotometry. The refractive index n and extinction coefficients k of the thin films and substrate are obtained in the range of 185~450 nm. It is found that the refractive index inhomogeneity of LaF3 thin films decreases as the film thickness becomes thick. The calculated optical performances curves fits the experimental ones well when the inhomogeneous model is employed, which can improve the precision of thin film′s optical constants determination.
    Chang Yanhe, Jin Chunshui, Li Chun, Jin Jingcheng. Characterization of Optical Constants of Ultraviolet LaF3 Films by Thermal Evaporation[J]. Chinese Journal of Lasers, 2012, 39(8): 807002
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