• Laser Journal
  • Vol. 45, Issue 5, 41 (2024)
WANG Kaixin1, HUANG Dan2,*, YU Yongxing1, and ZHOU Hongcheng1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.14016/j.cnki.jgzz.2024.05.041 Cite this Article
    WANG Kaixin, HUANG Dan, YU Yongxing, ZHOU Hongcheng. High density flexible packaging substrate defect detection method based on CRS-YOLO algorithm[J]. Laser Journal, 2024, 45(5): 41 Copy Citation Text show less
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    WANG Kaixin, HUANG Dan, YU Yongxing, ZHOU Hongcheng. High density flexible packaging substrate defect detection method based on CRS-YOLO algorithm[J]. Laser Journal, 2024, 45(5): 41
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