• Optics and Precision Engineering
  • Vol. 16, Issue 1, 42 (2008)
1,2, 1,2, 1,2, 1, and 1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. 30.4 nm filter in normal incidence imager[J]. Optics and Precision Engineering, 2008, 16(1): 42 Copy Citation Text show less
    References

    [1] SCHULZE D W,SANDEL B R.Multilayer mirrors and filters for imaging the earth's inner magnetosphere[J].SPIE,1991,1549:319-328.

    [2] KORTRIGH J B,UNDERWOOD J H.Design considerations for multilayer coated Schwarzschild objectives for the XUV[J].SPIE,1990,1343:95-103.

    [7] SANSONETTI J E,MARTIN W C,YOUNG S L.Handbook of basic atomic spectroscopic data(version 1.1)[DB/OL].Gaithersburg:National Institute of Standards and Technology,2004[2004-10-08].http://phsics.nist.gov/Handbook

    [8] POWELL F R,DRAKE V A.Selection of materials for soft X-ray (SXR) and extreme ultraviolet (EUV) filters for space astronomy and other applications[J].SPIE,1994,2209:480-490.

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. 30.4 nm filter in normal incidence imager[J]. Optics and Precision Engineering, 2008, 16(1): 42
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