• Chinese Optics Letters
  • Vol. 17, Issue 1, 012601 (2019)
Huijie Zhao1、*, Jian Xing1, Xingfa Gu2, and Guorui Jia1、**
Author Affiliations
  • 1School of Instrumentation Science and Opto-electronics Engineering, Beihang University, Beijing 100191, China
  • 2Institute of Remote Sensing and Digital Earth, Chinese Academy of Sciences, Beijing 100094, China
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    DOI: 10.3788/COL201917.012601 Cite this Article Set citation alerts
    Huijie Zhao, Jian Xing, Xingfa Gu, Guorui Jia. Polarization imaging in atmospheric environment based on polarized reflectance retrieval[J]. Chinese Optics Letters, 2019, 17(1): 012601 Copy Citation Text show less

    Abstract

    A method for calculating the atmospheric parameters measurement accuracy requirement based on polarized reflectance retrieval is proposed. The at-sensor polarization states with different atmospheric parameters content are simulated based on the atmospheric radiative transfer model in order to select the key parameter affecting the polarization observation. The accuracy requirement of atmospheric parameters is derived through the polarized reflectance retrieval method. Experiment results show that retrieval accuracy of polarized reflectance of typical ground objects can be up to 90%. The atmospheric parameters measurement accuracy requirement when the retrieval accuracy is more than 75% is derived.
    Ls=Lr+Ld+Lu,(1)

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    Lr=Tr(θr)Fr(θi,θr,φ)Ti(θi)cosθiEs(θi),(2)

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    Ld=Tr(θr)ΩiFr(θi,θr,φ)cosθiLdΩi(θi,φi)dΩi,(3)

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    Lu=Lu(θr,φr),(4)

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    TrFrTicosθiEs=LsTrΩiFrcosθiLdΩidΩiLu.(5)

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    Tr[f00f10f20]TicosθiEs=LsTrΩiFrcosθiLdΩidΩiLu,(6)

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    [f00f10f20]=LsTrΩiFrcosθiLdΩidΩiLuTrTicosθiEs.(7)

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    [f00f10f20]=LsLuTrTicosθiEsTrΩiFrcosθiLdΩidΩiTrTicosθiEs=LsLuTrTicosθiEs[ε0ε1ε2],(8)

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    [f00+ε0f10+ε1f20+ε2]=LsLuTrTicosθiEs.(9)

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    α=Q2+U2I,η=12arctanUQ,(10)

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    eij=|rijrij0|rij0×100%,(11)

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    Mr=neij2n×100%,(12)

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    Huijie Zhao, Jian Xing, Xingfa Gu, Guorui Jia. Polarization imaging in atmospheric environment based on polarized reflectance retrieval[J]. Chinese Optics Letters, 2019, 17(1): 012601
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