• Journal of Applied Optics
  • Vol. 43, Issue 3, 415 (2022)
Yi LU1, Wanjie REN1, Guojian GUO1, Xinran YOU1..., Guoxing HU1, Lijun WU1 and Xun SUN2,*|Show fewer author(s)
Author Affiliations
  • 1Shandong Non-metallic Materials Institute, China North Industries Group Corporation Limited, Jinan 250001, China
  • 2Key Laboratory of High Efficiency and Clean Mechanical Manufacture (Ministry of Education), School of Mechanical Engineering, Shandong University, Jinan 250061, China
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    DOI: 10.5768/JAO202243.0301006 Cite this Article
    Yi LU, Wanjie REN, Guojian GUO, Xinran YOU, Guoxing HU, Lijun WU, Xun SUN. Optical system design of spectrometer with double Rowland circle structure[J]. Journal of Applied Optics, 2022, 43(3): 415 Copy Citation Text show less
    Optical structure diagram of Rowland circle
    Fig. 1. Optical structure diagram of Rowland circle
    Overall design of optical path of double Rowland circle
    Fig. 2. Overall design of optical path of double Rowland circle
    Diagram of optical path from plane-convex mirror to incident slit
    Fig. 3. Diagram of optical path from plane-convex mirror to incident slit
    Structure simulation diagram and imaging plane spot diagram of Rowland circle in wavelength range of 500 nm~700 nm
    Fig. 4. Structure simulation diagram and imaging plane spot diagram of Rowland circle in wavelength range of 500 nm~700 nm
    Structure simulation diagram and imaging plane spot diagram of Rowland circle in wavelength range of 200 nm~500 nm
    Fig. 5. Structure simulation diagram and imaging plane spot diagram of Rowland circle in wavelength range of 200 nm~500 nm
    Effect of position of signal receiving device on aberration
    Fig. 6. Effect of position of signal receiving device on aberration
    Signal acquisition device and its placement
    Fig. 7. Signal acquisition device and its placement
    Spot diagram of 253.65 nm and 253.25 nm spectral lines with different slit widths
    Fig. 8. Spot diagram of 253.65 nm and 253.25 nm spectral lines with different slit widths
    Spot diagram of full-band characteristic and edge spectral lines of spectrometer
    Fig. 9. Spot diagram of full-band characteristic and edge spectral lines of spectrometer
    光栅线数k /(线/mm) 波长范围/nm
    1 200376.649~939.664
    1 600359.552~781.784
    2 400188.324~469.832
    Table 1. Wavelength range of each line number at incident angle of 40°
    入射角α /(°) 200 nm对应衍射角β /(°) 可检测光谱范围/nm
    20−7.93200~285
    301.15200~417
    409.37200~536
    5016.62200~638
    6022.71200~722
    Table 2. Maximum spectral range detected at different incident angles
    光学元件位置参数数值
    入射狭缝到衍射光栅距离f1305.52 mm
    200 nm~500 nm 光路的衍射光栅 到第1个平面镜距离l1213.67 mm
    入射角及反射角64.5°
    第1个平面镜到第2个平面镜距离l2213.67 mm
    入射角及反射角10°
    第2个平面镜到第2个衍射光栅距离f1199.42 mm
    入射角60°
    Table 3. Position distance parameters of each component of optical path in wavelength range of 500 nm~700 nm
    初始结构优化结构
    边缘波长/nm像差/μm最大像差处波长/nm像差/μm
    325.82156.42311.38154.70
    375.67156.66340.18155.49
    430.62181.79417.15175.85
    476.16173.08443.92171.37
    523.65135.68536.93127.30
    569.18124.93556.46122.97
    617.37160.37628.67147.36
    655.47142.08645.01140.17
    Table 4. Comparison of maximum aberration of initial and optimal structures
    Yi LU, Wanjie REN, Guojian GUO, Xinran YOU, Guoxing HU, Lijun WU, Xun SUN. Optical system design of spectrometer with double Rowland circle structure[J]. Journal of Applied Optics, 2022, 43(3): 415
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