• Opto-Electronic Engineering
  • Vol. 39, Issue 11, 134 (2012)
WANG Cong*, JIN Shang-zhong, and YUAN Kun
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2012.11.021 Cite this Article
    WANG Cong, JIN Shang-zhong, YUAN Kun. Improvement of Dual-optical Path d/0 Condition on Spectrophotometer[J]. Opto-Electronic Engineering, 2012, 39(11): 134 Copy Citation Text show less

    Abstract

    In order to eliminate the errors resulting from fluctuation of light source, the inner surface of integrating sphere is selected as reference in design of dual-optical path d/0 measuring condition on spectrophotometer. However, the repeatability and accuracy of measurement will decrease to a certain degree because of interference by diffuse reflected light of the test sample. This paper improves the dual-optical path d/0 measuring condition, composites LED as test light source, and configures a separated referenced white board substitute for inner surface of integrating sphere in the reference optical path. Then, the experiment is established. The results indicate that this improved dual-optical path d/0 measuring condition could effectively revise the errors caused by diffuse reflected light of test sample.
    WANG Cong, JIN Shang-zhong, YUAN Kun. Improvement of Dual-optical Path d/0 Condition on Spectrophotometer[J]. Opto-Electronic Engineering, 2012, 39(11): 134
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