Structure and Application of a Sub-surface Mapping System for Examining the Defects of Metal Material

[in Chinese]; [in Chinese]

Journals >Acta Photonica Sinica >Volume 33 >Issue 10 >Page 1207 > Article

Acta Photonica Sinica
Vol. 33, Issue 10, 1207 (2004)

Structure and Application of a Sub-surface Mapping System for Examining the Defects of Metal Material

[in Chinese] and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese]. Structure and Application of a Sub-surface Mapping System for Examining the Defects of Metal Material[J]. Acta Photonica Sinica, 2004, 33(10): 1207 Copy Citation Text

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Abstract

[in Chinese], [in Chinese]. Structure and Application of a Sub-surface Mapping System for Examining the Defects of Metal Material[J]. Acta Photonica Sinica, 2004, 33(10): 1207

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