• Chinese Journal of Lasers
  • Vol. 49, Issue 6, 0603001 (2022)
Weirong Yang, Yongqiang Pan*, and Zhiqi Zheng
Author Affiliations
  • School of Optoelectronic Engineering, Xi’an Technological University, Xi’an, Shaanxi 710021, China
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    DOI: 10.3788/CJL202249.0603001 Cite this Article Set citation alerts
    Weirong Yang, Yongqiang Pan, Zhiqi Zheng. Regulation of Electric Field Intensity at Interface and Light Scattering Characteristics of Highly Reflective Multilayer Dielectric Films[J]. Chinese Journal of Lasers, 2022, 49(6): 0603001 Copy Citation Text show less
    Schematic of space relationship of BRDF
    Fig. 1. Schematic of space relationship of BRDF
    Surface reflectance of three film systems versus incident wavelength
    Fig. 2. Surface reflectance of three film systems versus incident wavelength
    Square of normalized electric field intensity for three film systems. (a) G/(HL)8/A; (b) G/(HL)8H/A; (c) G/(HL)6H0.4L1.6H1.5L0.5H/A
    Fig. 3. Square of normalized electric field intensity for three film systems. (a) G/(HL)8/A; (b) G/(HL)8H/A; (c) G/(HL)6H0.4L1.6H1.5L0.5H/A
    BR·cos θs versus scattering angle for three film systems
    Fig. 4. BR·cos θs versus scattering angle for three film systems
    Total scattering loss versus incident light wavelength for different film surfaces
    Fig. 5. Total scattering loss versus incident light wavelength for different film surfaces
    Measured BR·cos θs versus scattering angle for different film systems
    Fig. 6. Measured BR·cos θs versus scattering angle for different film systems
    InterfaceG /(HL)8/AG /(HL)8H/AG /(HL)6H0.4L1.6H1.5L0.5H/A
    Interface 13.988000.0044
    Interface 200.78970.4549
    Interface 31.679100.0244
    Interface 400.33250.2727
    Table 1. Square of normalized electric field intensity for different film system interfaces
    Weirong Yang, Yongqiang Pan, Zhiqi Zheng. Regulation of Electric Field Intensity at Interface and Light Scattering Characteristics of Highly Reflective Multilayer Dielectric Films[J]. Chinese Journal of Lasers, 2022, 49(6): 0603001
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