A Method for Testability Verification of Armament Based on Data of Service Stage

YU Long-hai; SHI Xian-jun; XIAO Zhi-cai

doi:10.3969/j.issn.1671-637x.2016.06.020

Journals >Electronics Optics & Control >Volume 23 >Issue 6 >Page 90 > Article

Electronics Optics & Control
Vol. 23, Issue 6, 90 (2016)

A Method for Testability Verification of Armament Based on Data of Service Stage

YU Long-hai, SHI Xian-jun, and XIAO Zhi-cai

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[in Chinese]

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DOI: 10.3969/j.issn.1671-637x.2016.06.020 Cite this Article

YU Long-hai, SHI Xian-jun, XIAO Zhi-cai. A Method for Testability Verification of Armament Based on Data of Service Stage[J]. Electronics Optics & Control, 2016, 23(6): 90 Copy Citation Text

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References

[8] OTTAVI M. Evaluating the yield of repairable SRAMs for ATE［J］. IEEE Transactions on Instrumentation and Mea-surement, 2006, 55(10):1704-1712.

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YU Long-hai, SHI Xian-jun, XIAO Zhi-cai. A Method for Testability Verification of Armament Based on Data of Service Stage[J]. Electronics Optics & Control, 2016, 23(6): 90

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