[1] R. Chow, J. R. Taylor, and Z. L. Wu, Appl. Opt. 39, 650 (2000).
[2] L. Gallais and M. Commandr′e, Appl. Opt. 45, 1416 (2006).
[3] Z. Wu, C. J. Stolz, S. C. Weakley, J. D. Hughes, and Q. Zhao, Appl. Opt. 40, 1897 (2001).
[4] B. Bertussi, J.-Y. Natoli, and M. Commandr′e, Appl. Opt. 45, 1410 (2006).
[5] Z. L. Wu, P. K. Kuo, Y. S. Lu, S. T. Gu, and R. Krupka, Thin Solid Films 290-291, 271 (1996).
[6] C. Xu, H. Dong, J. Ma, Y. Jin, J. Shao, and Z. Fan, Chin. Opt. Lett. 6, 228 (2008).
[7] C. Wang, Z. Han, Y. Jin, J. Shao, and Z. Fan, Chin. Opt. Lett. 6, 773 (2008).
[8] O. Breitenstein, M. Langenkamp, F. Altmann, D. Katzer, A. Lindner, and H. Eggers, Rev. Sci. Instrum. 71, 4155(2000).
[9] A. Dubois, A. C. Boccara, and M. Lebec, Opt. Lett. 24, 309 (1999).
[10] E. Beaurepaire, A. C. Boccara, M. Lebec, L. Blanchot, and H. Saint-Jalmes, Opt. Lett. 23, 244 (1998).
